HTRC-800型高温导电材料电阻率测试系统

关键词：电导率，电阻率，高温600℃，两探针，四探针

     HTRC-800型高温导电材料电阻率测试系统是一款用于测量材料电阻，电导率的专用设备，采用由四端测量方法测试电阻率系统与高温试验箱为一体的专用的高温测试系统，满足半导体及导体材料因温度变化对电阻值变化的 测量要求，通以在高温  、真空、气氛的条件下测量导电材料电阻和电阻率，可以分析被测样的电阻和电阻率随温度、 时间变化的曲 线． 目前主要针对圆片、方块、长条等样品进行测试，可以广泛用于碳系导电材料、 金属系导电材料、 金属氧化物系导电材料、结 构型高分子导电材料、复合导电材料等材料的电阻率测量。 测控软件可以显示出温度与电阻，电阻率，电导率数据的变化曲线。

一、主要应用范围：

1、  广泛用于碳系导电材料的电阻率和电导率测量

2、  金属系导电材料的电阻率和电导率测量

3、  金属氧化物系导电材料的电阻率和电导率测量

4、  高分子导电材料的电阻率和电导率测量

5、  复合导电材料等材料的电阻率测量

6、  可以测量硅、锗单晶（棒料、晶片）电阻率

7、  符合标准：ASTM B193-02和GBT 6146-2010 、GBT15662-1995

8、  产品主要特点：

1、高温两探针夹具与带升降高温测试平台配合使用，组成高温两探针测试平台；

2测温热电偶探头与样品平台为同一热沉，确保测量温度与样品温度的一致性；

3、采用紧凑型设计，体积小、结构简洁，操作简单、方便；

4' 隔热盘隔离样品平台与调节平台，并与高温测试平台重合，具有理想的隔热保温效果；

5、  探针调节装置具有三维精确调节功能，精确定位探针的位置；

6、  探针调节装置具有粗调功能，有效增大探针的调节范围；

7、  探针调节装置带探针压力调节功能，确保探针与样品的良好接触，又不损伤样品；

8、  探针采用带同轴屏蔽层设计，减少电磁对测量的干扰；

9、探针电极选用铂铱合金，有效减少接触电阻，并具有良好的高温抗氧化能力；

10、自带校准件，与各测试仪器配套，校准测试夹具。

主要技术参数：

1、测量温度范围：RT~600℃或RT~800℃或RT~1200℃可选

2、测试探针：     2个高温高频探针或4个高频探针

3、电极直径：26.8mm

4、样品大小：厚度小于10 mm，直径5~40mm

5、温控方式：恒温、变温、常温

6、控温精度：±0.4℃

7、电阻率：10nΩ-10MΩ

8、电阻：10nΩ-100MΩ

9、电导率：10-5 ～105 s/cm

10、重量：38KG

11、工作温度：5℃至40℃

12、重量：15KG

13、可以配合任意型号Agilent 、 WayneKer r 、 So lar tron 、 同惠、 Keysight

等LCR表进行无缝结合

14、设备可以配合ZJ-3型和ZJ-6型压电测试仪进行压电D33系数测量

HTRC-600 resistivity testing system for high temperature conductive materials is a special equipment for measuring material resistance and conductivity. It adopts a special high temperature testing system consisting of a four-terminal resistivity measuring system and a high temperature test box to meet the measurement requirements of resistance changes of semiconductor and conductive materials due to temperature changes. It can be used in high temperature, vacuum and atmosphere. Measuring the resistance and resistivity of conductive material under a piece can analyze the curve of the resistance and resistivity changing with temperature and time. At present, the test is mainly aimed at disc, square, strip and other samples, which can be widely used in carbon conductive material, metal conductive material, metal oxide conductive material, structural polymer conductive material, composite conductive material and so on. Resistivity measurement of materials. Advanced measurement and control software can show the curves of temperature and resistance, resistivity and conductivity data.

I. Main applications:
1. Widely used for resistivity and conductivity measurement of carbon-based conductive materials
2. Measurement of resistivity and conductivity of metal conductive materials
3. Measurement of resistivity and conductivity of metal oxide conductive materials
4. Measurement of Resistivity and Conductivity of Polymer Conductive Materials
5. Resistivity Measurement of Composite Conductive Materials and Other Materials
6. Measurable resistivity of silicon and germanium single crystals (rods and wafers)
7. Compliance criteria: ASTM B193-02 and GBT 6146-2010, GBT 15662-1995
8. Main features of the product:
1. The high temperature two-probe fixture is used in conjunction with the high temperature test platform with lifting and lowering to form a high temperature two-probe test platform.
The thermocouple probe and the sample platform are the same heat sink to ensure the consistency between the measured temperature and the sample temperature.
3. Compact design, small size, simple structure, simple operation and convenience;
4. Isolating the sample platform and adjusting platform of the heat insulation disk, and coinciding with the high temperature test platform, it has ideal heat insulation effect.
5. The probe adjusting device has three-dimensional precise adjusting function, which can accurately locate the position of the probe.
6. The probe adjusting device has the function of coarse adjustment, which effectively enlarges the adjusting range of the probe.
7. The probe regulator has the function of adjusting the pressure of the probe to ensure the good contact between the probe and the sample without damaging the sample.
8. The probe is designed with coaxial shielding layer to reduce electromagnetic interference to measurement.
9. The platinum-iridium alloy is selected as probe electrode, which can effectively reduce the contact resistance and has good high temperature oxidation resistance.
10. Bring calibration parts with each test instrument to calibrate test fixture.
Main technical parameters:
1. Measuring Temperature Range: RT~600 C or RT~800 C or RT~1200 C is optional.
2. Test Probes: Two High Temperature and High Frequency Probes or Four High Frequency Probes
3. Electrode diameter: 26.8mm
4. Sample size: less than 10 mm in thickness and 5-40 mm in diameter
5. Temperature Control: Constant Temperature, Variable Temperature and Normal Temperature
6. Temperature Control Accuracy: +0.4 C
7. Resistivity: 10n-10MΩ
8. Resistance: 10n-100MΩ
9. Conductivity: 10-5-105 s/cm
10. Weight: 38KG
11. Working Temperature: 5 40 C
12. Weight: 15K
13. Can cooperate with any type of Agilent, Wayne Ker, So lar tron, Tonghui, Keysight
Seamless Combination of Equal LCR Table

14. The equipment can cooperate with ZJ-3 and ZJ-6 piezoelectric testers to measure piezoelectric D33 coefficients.