介电常数测试仪介质损耗测试仪满足标准：GBT 1409-2006测量电气绝缘材料在工频、音频、高频（包括米波波长在内）下电容率和介质损耗因数的*方法
一、介电常数介质损耗试验仪概述

GDAT高频 Q 表作为一代的通用、多用途、多量程的阻抗测试仪器，测试频率上限达到目前高的160MHz。
GDAT高频 Q 表采用了多项技术：

双扫描技术 - 测试频率和调谐电容的双扫描、自动调谐搜索功能。
双测试要素输入 - 测试频率及调谐电容值皆可通过数字按键输入。
双数码化调谐 - 数码化频率调谐，数码化电容调谐。
自动化测量技术 -对测试件实施 Q 值、谐振点频率和电容的自动测量。
全参数液晶显示 – 数字显示主调电容、电感、 Q 值、信号源频率、谐振指针。
DDS 数字直接合成的信号源 -确保信源的高葆真，频率的高精确、幅度的高稳定。
计算机自动修正技术和测试回路*化 —使测试回路 残余电感减至zui低，** Q 读数值在不同频率时要加以修正的困惑。
gdat高频Q表的创新设计，无疑为高频元器件的阻抗测量提供了*的解决方案，它给从事高频电子设计的工程师、科研人员、高校实验室和电子制造业提供了更为方便的检测工具
，测量值更为精确，测量效率更高。使用者能在仪器给出的任何频率、任意点调谐电容值下检测器件的品质，无须关注量程和换算单位。
一、介电常数测试仪介质损耗测试仪仪概述
介质损耗和介电常数是各种电瓷、装置瓷、电容器等陶瓷，还有复合材料等的一项重要的物理性质，通过测定介质损耗角正切tanδ及介电常数（ε），可进一步了解影响介质损耗和介电常数的各种因素，为提高材料的性能提供依据；仪器的基本原理是采用高频谐振法，并提供了，通用、多用途、多量程的阻抗测试。它以单片计算机作为仪器的控制，测量核心采用了频率数字锁定，标准频率测试点自动设定，谐振点自动搜索，Q值量程自动转换，数值显示等新技术，改进了调谐回路，使得调谐测试回路的残余电感减至zui低，并保留了原Q表中自动稳幅等技术，使得新仪器在使用时更为方便，测量值更为精确。仪器能在较高的测试频率条件下，测量高频电感或谐振回路的Q值，电感器的电感量和分布电容量，电容器的电容量和损耗角正切值，电工材料的高频介质损耗，高频回路有效并联及串联电阻，传输线的特性阻抗等。
该仪器用于科研机关、学校、工厂等单位对无机非金属新材料性能的应用研究。
 
  主要技术特性 
Q 值测量范围  2 ～ 1023 ， 量程分档： 30 、 100 、 300 、 1000 ，自动换档或手动换档 
固有误差  ≤ 5 ％ ± 满度值的 2 ％（ 200kHz ～ 10MHz ）， ≤6％ ± 满度值的2％（10MHz～160MHz） 
工作误差  ≤7％ ± 满度值的2％ （ 200kHz ～ 10MHz ）， ≤8％ ± 满度值的2％（10MHz～160MHz） 
电感测量范围  4.5nH ～ 140mH 
电容直接测量范围  1 ～ 200pF 
主电容调节范围  18 ～ 220pF 
主电容调节准确度  100pF 以下 ± 1pF ； 100pF 以上 ± 1 ％ 
信号源频率覆盖范围  100kHz ～ 160MHz 
频率分段 （ 虚拟 ）  100 ～ 999.999kHz ， 1 ～ 9.99999MHz,10 ～ 99.9999MHz ， 100 ～ 160MHz 
频率指示误差  3 × 10 -5 ± 1 个字 

搭配了全新的介质损耗装置与GDAT系列q表搭配使用
一 . 概述

BD916介质损耗测试装置与本公司生产的各款高频Q表配套，可用于测量绝缘材料的介电常数和介质损耗系数（损耗角正切值）。
BD916介质损耗测试装置是BD916914的换代产品，它采用了数显微测量装置，因而读数方便，数据精确。
测试装置由一个LCD数字显示微测量装置和一对间距可调的平板电容器极片组成。
平板电容器极片用于夹持被测材料样品，微测量装置则显示被测材料样品的厚度。
BD916介质损耗测试装置须配用Q表作为调谐指示仪器，通过被测材料样品放进平板电容器和不放进样品时的Q值变化，测得绝缘材料的损耗角正切值。
从平板电容器平板间距的读值变化则可换算得到绝缘材料介电常数。

BD916介质损耗测试装置技术特性

平板电容器： 极片尺寸：Φ50mm/Φ38mm 可选 　　　　　
极片间距可调范围：≥15mm
2. 夹具插头间距：25mm±0.01mm
3. 夹具损耗正切值≤4×10-4 （1MHz）
4．测微杆分辨率：0.001mm
 
电感：
 
线圈号    测试频率    Q值    分布电容p       电感值 
  9         100KHz      98       9.4           25mH
  8         400KHz     138       11.4        4.87mH
  7         400KHz    202       16           0.99mH
  6           1MHz     196       13          252μH
  5           2MHz     198       8.7        49.8μH
  4         4.5MHz    231       7             10μH
  3          12MHz      193     6.9         2.49μH
  2          12MHz      229     6.4        0.508μH
            
  1   25MHz，50MHz   233，211    0.9       0.125μHDielectric constant dielectric loss tester to meet standards: GBT 1409-2006 measurement of electrical insulating materials at power, audio frequency, high frequency （ including meter wavelengths ） of the permittivity and dielectric loss factor of the recommended method
One, the dielectric constant dielectric loss tester overview
GDAT frequency Q table as the latest generation of universal, multi-purpose, multiple range impedance test apparatus, test frequency to achieve the highest domestic 160MHz.
GDAT HF Q meter employs a number of leading technology:
Double scan technique - testing frequency and tuning capacitor double scanning, automatic tuning the search function.
Double test element input - testing frequency and tuning capacitor value can be via a digital key input.
Dual digital tuning - digital frequency tuning, digital tuning capacitor.
Automatic measurement technology - on test implementation of Q value, resonant frequency and capacitance measurement.
The parameters of liquid crystal display, digital display main capacitor, inductance, Q value, signal source frequency, resonant pointer.
DDS direct digital synthesis signal source to ensure that the source of high frequency Baozhen, high precision, high stability margin.
Computer automatic correction and test loop optimization - make test loop residual inductance to a minimum, the complete eradication of Q reading values at different frequencies to be amended puzzle.
Gdat HF Q form innovation design, no doubt for the high frequency components of the impedance measurement provides the perfect solution, it gives in high-frequency electronic design engineers, researchers, university laboratory and electronics manufacturing industry to provide a more convenient detection tool
Measurement, measuring is more accurate, more efficient. The user can at any given frequency apparatus, arbitrary point tuning capacitance detection device without attention to quality, range and conversion unit.
One, the dielectric constant dielectric loss tester overview
Dielectric loss and dielectric constant are all kinds of porcelain, porcelain, ceramic capacitor device, and composite materials is an important physical properties, by measuring the dielectric loss tangent of dielectric constant （ Tan δ andε）, to further understand the effects of dielectric loss and dielectric constant of the various factors, in order to improve the material the property basis; instrument basic principle is the use of high frequency resonance method, and provides, universal, multi-purpose, multiple range impedance test. It uses single-chip computer as the control core of measuring instrument, using the frequency locking, frequency standard test point automatic setting, resonant point automatic search, Q value range automatic conversion, numerical display and other new technology, improved the tuning circuit, the tuning circuit for testing the residual inductance is reduced to the minimum, and retains the original Q table in the automatic amplitude stabilizer technology, makes the new instrument in the use of more convenient, measurement is more accurate. Instrument in high frequency test conditions, measurement of high frequency inductive or resonant loop of the Q value, the inductance of the inductor is the amount and distribution of capacitance, capacitance and loss angle tangent value of electrical materials, dielectric loss in high frequency, high frequency circuit in parallel and series resistance, the characteristic impedance of the transmission line and so on.
The apparatus used in scientific research institutions, schools, factories and other units to inorganic metalloid new material property application research.
Main technical characteristics
Q measurement range of 2 ~ 1023, range profile: 30, 100, 300, 1000, automatic or manual shift
Inherent error≤5% ±full scale value of 2% （ 200kHz ～10MHz ）, 6%±full scale value of 2% （ 10MHz ～160MHz ）
Operating error≤7% ±full scale value of 2% （ 200kHz ～10MHz ）, 8%±full scale value of 2% （ 10MHz ～160MHz ）
Inductance measuring range of 4.5nH～ 140mH
Capacitance measuring range 1～ 200pF
The main capacitor regulation range 18～ 220pF
The main capacitor regulation accuracy below 100pF± 1pF±1%; 100pF
Signal source frequency coverage range of 100kHz～ 160MHz
Frequency segmentation （ virtual ） 100～ 999.999kHz, 1～ 9.99999MHz, 10～ 99.9999MHz, 100～ 160MHz
Frequency indication error of 3× 10 -5±1 words
With a new dielectric dissipation device with GDAT Series Q table use
A. An overview
BD916 dielectric loss test device and the company's production of various high-frequency Q matching table, can be used to measure the insulating material of the permittivity and dielectric dissipation factor （ Tan ）.
BD916 dielectric loss test device is the replacement of BD916914, it uses a number of microscope measuring device, so the reading is convenient, accurate data.
The test device consists of a LCD digital display device for measuring and a pair of spaced adjustable flat plate capacitor pole pieces.
Flat capacitor polar plate for holding the material to be measured sample, micro measuring device would display the measured sample of the material thickness.
BD916 dielectric loss test device shall be equipped with the Q table as a tuning indicator instrument, through the tested samples of materials into the panel capacitor and do not put it in the sample when the variation of Q value, the measured dielectric material loss angle tangent value.
From the panel capacitor plate spacing reading variation can be calculated in terms of dielectric material.
BD916 dielectric loss test device technical characteristics
Flat capacitor: pole piece size:Φ 50mm/Φ 38mm optional
Pole spacing adjustable range:≥ 15mm
The 2 clamp plug spacing: 25mm± 0.01mm
The 3 fixture loss tangent value ≤ 4× 10-4 （ 1MHz ）
4 micrometer rod resolution: 0.001mm
Inductance:
Coil test frequency distributions of Q values of P inductance capacitance
9 100KHz 989.4 25mH
8 400KHz 13811.4 4.87mH
7 400KHz 20216 0.99mH
6 1MHz 19613252 μ H
5 1988.7 49.8 μ H 2MHz
4 4.5MHz 231710 μ H
3 1936.9 2.49 μ H 12MHz
2 2296.4 0.508 μ H 12MHz
1 25MHz, 0.125μ H 50MHz 2332110.9