• Simultaneous error measurement of various error parameters
The error count (bit error, parity error, and CRC error, etc.) error rate,
block error count, block error rate, US, %US, SES, %SES, DM, %DM,
ES, %ES, EFS, %EFS, AT, %AT, BBER, clock slip, and synchronization
loss can be measured, Alarm states such as AIS can be continuously
monitored*.
*: Conforms to ITU-T G.821

• Data will not be lost if a power failure occurs during measurement
If an AC power failure occurs during error rate measurements, all data
obtained prior to the failure is recalled from memory and the measurement
is automatically continued when the power is resupplied. When
the power returns, the time at which power failure occurred is displayed
on the EL display.

• Storage and statistical analysis of error measurement data
When a error analysis unit is used, the error measurement data can
be stored in the unit. The of stored data analyses can be displayed
as a histogram.