Agilente86100A眼图分析仪-深圳市宏盛仪器科技有限公司手机版

详细介绍

租赁、供应Agilent86100A,Agilent86100A,Agilent86100C,Agilent86100D光带宽眼图分析仪

带宽	无
显示屏尺寸	10.4 英寸
本底噪声	无
支持的数据速率	无
输入类型	无
模块类型	光电 TDR
应用	用户定义应用软件光 TX 100GBASE-CR10 (IEEE 802.3ba) 100GBASE-CR4 (IEEE 802.3bj) 100GBASE-KR4 10GBASE-KR (IEEE 802.3ap) 40GBASE-CR4 40GBASE-KR4 (IEEE 802.3bj) CAUI
操作系统	Windows 7
等效时间	是

选件和升级

选件
- Trigger and Timebase
- Fixed Node-Locked SW Licenses
- Storage
- Calibration Documentation
- Peripheral Connection
- Accessories
- Transportable SW Licenses
保修、校准和服务
- Calibration service plan

选件

了解详细信息: 查看配置指南

Trigger and Timebase
86100D-ETR	Enhanced trigger, 13 GHz BW, pattern and module trigger
86100D-STR	Standard trigger 3.2 GHz BW (default option)
86100D-PTB	Internal Precision Timebase

Fixed Node-Locked SW Licenses
86100D-SIM	InfiniiSim-DCA 波形转换工具套件用于 86100 系列 DCA 宽带宽示波器的 InfiniiSim-DCA 提供去嵌入、嵌入和虚拟探测功能，能够帮助工程师更全面地表征高速数字设计并改进裕量。查看详情
86100D-300	幅度分析/RIN/Q 因数 86100D-300 幅度分析/RIN/Q 因数软件可将抖动模式扩展至幅度域，帮助您迅速确定引起眼图闭合的原因，并报告相对强度噪声（RIN）、RIN-OMA 和 Q 因数。查看详情
86100D-202	86100C-202 增强型阻抗和 S 参数软件使用 86100D-202 软件，只需按下一个按钮便可执行实时 S 参数测量。查看详情
86100D-201	波形分析软件波形分析软件是一款针对 86100C DCA-X 的软件选件，能够生成超深存储器波形文件，支持实时 MATLAB 分析，并集成内置的线性前馈均衡器（LFE）。查看详情
86100D-200	增强型抖动分析软件随着数据速率的增加，精确的抖动分析（包括将抖动分解为各个组成成分）变得日益重要。查看详情
86100D-062	MATLAB - Standard Digital Analysis Package, Fixed Perpetual License
86100D-061	MATLAB - Basic Digital Analysis Package, Fixed Perpetual License
86100D-500	生产力套装软件在测试并联的多个发射机时，能够对眼图进行自动定标和偏移校正尽量减少由亚速率触发所导致的不完整眼图，以及其后的测量结果变化性能可与 86100D 带宽示波器相媲美查看详情
86100D-401	Advanced Eye Analysis Software, Fixed Perpetual License
86100D-9FP	86100D-9FP 用于 86100D DCA-X 示波器的 PAM-N 分析软件全面的脉冲幅度调制（PAM-4）信号分析电和光信号眼宽、眼高、眼图偏移电平幅度、电平噪声、电平偏移线性度测量等查看详情
86100D-BFP	Automatic Fixture Removal in TDR Mode, Fixed Perpetual License
86100D-TFP	IEEE TDECQ analysis, fixed perpetual license

Storage
86100D-092	Internal hard drive (default option)
86100D-090	Removable hard drive

Calibration Documentation
86100D-UK6	Commercial calibration certificate with test data

Peripheral Connection
86100D-GPN	No GPIB Card Interface
86100D-GPI	GPIB Card Interface - Installed




Accessories
86100D-AXE	Rack mount kit with handles
86100D-AX4	Rack mount kit without handles
86100D-AFP	Module slot filler panel



Transportable SW Licenses
86100DT-SIM	InfiniiSim-DCA Waveform Transformation SW, Transportable License
86100DT-500	Productivity Package, Transportable License
86100DT-401	Advanced Eye Analysis, Transportable License
86100DT-300	Advanced Amplitude Analysis/RIN/Q-Factor , Transportable License
86100DT-202	Enhanced Impedance and S-parameter Software, Transportable License
86100DT-201	Advanced Waveform Analysis, Transportable License
86100DT-200	Enhanced Jitter Analysis, Transportable License
86100DT-9TP	PAM-N Analysis SW, Transportable Perpetual License
86100DT-BTP	Automatic Fixture Removal in TDR Mode, Transportable License
86100DT-ETP	Flex Eye - Independent Channel Acquisition and Control, Transportable License
86100DT-TTP	IEEE TDECQ analysis, transportable perpetual license

保修、校准和维修

了解详细信息: 查看配置指南

PS-S10	Remote scheduled productivity assistance. Select 1 to 999 hours.

PS-S20-01	Recommended Startup assistance, daily

PS-S20	Startup assistance, daily


R-51B-001-5CC	Warranty Assurance Plan - RTK - 2 add'l years (Total 5 years)

Calibration service plan
R-50C-011-3	Calibration Assurance Plan - Return to Keysight - 3 years
R-50C-011-5	Calibration Assurance Plan - Return to Keysight - 5 years
R-50C-011-MU-3	Keysight Calibration + Uncertainties - 3 years
R-50C-011-MU-5	Keysight Calibration + Uncertainties - 5 years
R-50C-016-3	Keysight Calibration + Uncertainties + Guardbanding - 3 years
R-50C-016-5	Keysight Calibration + Uncertainties + Guardbanding - 5 years
R-50C-021-3	ANSI Z540-1-1994 Calibration - 3 years
R-50C-021-5	ANSI Z540-1-1994 Calibration - 5 years

技术指标

是德科技Infiniium DCA-X 86100D高带宽示波器主机和模块
DCA Accessories - Technical Overview

手册

探头资源中心
86100A/B/C/D Infiniium DCA Programmer's Guide
86100 Infiniium DCA Online Help Archive

手册和竞争力概览

Infiniium DCA-X 86100D Wide-Bandwidth Oscilloscope Mainframe and Modules - Brochure
开启测量新视野，助您实现设计
从电气到协议的 PCI Express® 设计与测试――手册
更多

选择与配置指南

86100D DCA Wide-Bandwidth Oscilloscope Family - Configuration Guide
DCA Selection and Configuration Guide

演示

86100D Infiniium DCA-X Wide-Bandwidth Oscilloscopes Demo
N4917B 光接收机极限测试解决方案 ― 优酷视频
N1010A FlexDCA Virtual Device Demonstration
更多

支持文档

探讨此产品如何应对特定的测量挑战。

应用说明
文章和案例分析

德科技等效时间采样示波器和实时示波器的差别？

是德科技信号完整性分析系列

Precision Jitter Transmitter - DesignCon 2005

Precision Jitter Transmitter whitepaper

Digital Communication Analyzer (DCA), Measure Relative Intensity Noise (RIN) - Application Note

Digital Communication Analyzer (DCA), Measure Relative Intensity Noise (RIN).

Time Domain Reflectometry Theory - Application Note

When compared to other measurement techniques, time domain reflectometry provides a more intuitive and direct look at the DUT's characteristics.

Equalization: The Correction and Analysis of Degraded Signals - Application Note

This whitepaper introduces engineers to the concepts of equalization and terms used in the development of emerging technologies that use standard materials (e.g., FR4) for buses and backplanes at ever higher rates.

Comparison of Different Jitter Analysis Techniques With a Precision Transmitter - Application Note

This white paper describes how various jitter analysis techniques give dissimilar results. Which is right? We built a precision jitter transmitter to compare results of different techniques where test sets were exposed to known levels of jitter.

Precision Jitter Analysis Using the Keysight 86100C DCA-J - Application Note

This product note provides a guide to making jitter measurements with the Keysight 86100C DCA-J.

“适用于高速数字通信的精密波形分析”技术概述

his document will discuss the Keysight 86108A precision waveform analyzer plug-in module with the Keysight 86100C DCA-J sampling oscilloscope mainframe for accurate analysis of high-speed digital communications signals.

Techniques for Higher Accuracy Optical Measurements - Application Note

Learn techniques for high accuracy optical measurements using System Impulse Response Correction

Techniques to Reduce Manufacturing Cost-of-Test of Optical Transmitters, Flex DCA Interface

Keysight continues innovating test methodologies to assist manufacturing engineers in meeting or beating cost-of-test reduction goals.

Techniques to Reduce Manufacturing Cost-of-Test of Optical Transmitters - Application Note

Pressures to reduce costs as data rates rise means manufacturing engineering managers and their engineers must be more creative in how to reduce costs before their competitors do.

SATA II Drive TX/RX Testing & Cable SI Testing Using the 86100C DCA-J - Technical Overview

SATA II Drive Tx/Rx Testing & Cable SI Test using 86100C DCA-J. Product Note 86100-8

High Precision Time Domain Reflectometry - Application Note

Time domain reflectometry (TDR) is a well-established technique for verifying the impedance and quality of signal pats in components, interconnects, and transmission lines.

Advanced Jitter Generation and Analysis Product Note - Application Note

This product note shows how the Keysight pulse generators can be used with the DCA-J Oscilloscope.

Jitter Measurements on Long Patterns Using 86100DU-401 Advanced Waveform Analysis - Application Note

To overcome pattern length limitations found in many of today’s jitter analysis tools, Keysight developed a Microsoft Office Excel-based application called 86100DU Option 401 Advanced Waveform Analysis

Total Jitter Measurements at Low Probability Levels, Using Optimized BERT Scan Method

This paper describes an optimized technique based on probabliity and statistics theory that enables accurate TJ measurements at the 1e-12 bit error ratio level in about 20 minutes at 10 Gbit/s.

Improving Optical Transceiver Extinction Ratio Measurement Accuracy

This paper discusses how to improve optical transceiver extinction ratio measurement accuracy by using reference receiver correction factors.

Jitter Analysis: The Dual-Dirac Model, RJ/DJ, and Q-Scale - Application Note

This paper provides a complete description of the dual-Dirac model, how it is used in technology standards and a summary of how it is applied on different types of test equipment.

产品简介