- 面议
起订量：
能量色散X荧光光谱仪
- 型号
详细信息
技术参数:
1. 元素分析范围从钠(Na)到铀(U)
Measurable elements: Na-U
2.. 元素含量分析范围为1ppm到99.99%
Element content: 1ppm-99.99%
3. 低检出限：1ppm
Detection limit: 1ppm
3. 测量时间：60-200秒(可调)
Measurement time: 60-200s (adjustable)
4. 仪器工作电源：AC220±5V
Power：AC220±5V
5. 能量分辨率为129±5eV
Energy resolution: 129±5 eV
6. X 射线光管大输出电流：1mA
X-ray tube maximum output current: 1mA
7. 极限压力：6.7×10-2 Pa
Ultimate pressure：6.7×10-2 Pa
8.样品腔尺寸：610*320*100(mm)（不抽真空）/Φ100*h75(mm) (真空样品腔)
Sample chamber size: 610*320*100(mm) (Without vacuum)/Φ100*h75(mm) (Vacuum)
9.多次测量重复性(以标准样品为准)：±0.05%（高含量）/±0.002%(微量)
Long-time working stability(subject to standard sample):±0.05%(high content)
/±0.002%(micro-content)
10.长期工作稳定性(以标准样品为准)±:0.06% (高含量）/±0.0025%(微量)
Excellent repeatability(subject to standard sample):0.06%((high content)/±0.0025%(micro-content)
产品特点：
1. 采用的美国SDD（SILICON DRIFT DETECTOR）硅漂移探测器,分辨率更高, 大大提高了轻元素的检出限，标准检出限较SI-PIN探测器提高100倍；测量范围更宽，基本涵盖了各种常规材料元素分析要求；
The silicon draft detector imported from America with higher energy resolution largely improves the detection limit of light elements which is 100 times higher than that of Si-pin detector. Measurement scope is wider which can almost meet element analysis requirements of all conventional material.
2. 配置美国数据集成处理系统,数据采集速度更快，测量更稳定，重复性和长期稳定性更好；
Data integration processing system imported from America makes data acquisition faster, measurement more stable with excellent repeatability and long-time stability.
3. 配置新开发的专用测量软件,集成多种图形计算方法,测量数据更精准，更稳定；
Up-to-date software integrating multiple image computering methods makes data measurement more accurate and stable.
4. 软件全面监控仪器主要核心部件运行状态,使用更安全；
Software full monitors core parts running ensures safe operation.
5. 配置专门开发的真空系统,真空性能更好,测试效果更佳；
Specialized vacuum system offers better vacuum performance and excellent testing results.
