在第三代系统中，新的3k检测器可生成更高分辨率的3D体数据集，即更多体素可以检测到更小的缺陷。

通过检测器的不同操作模式，扫描时间可减少多达75％，同时获得与2k检测器相当的体素尺寸。

蔡司METROTOM是一种工业计算机断层扫描系统，用于测量和检查由塑料或轻金属制成的完整部件。而在利用传统测量机测量时，此类隐藏性的结构信息只有将零件通过费时的层层破坏方能获得。

利用蔡司METROTOM 计算机断层扫描系统可一次扫描海量的零部件特征。这些测量结果非常精确，且具可追溯性。和接触式测量方法不同，蔡司METROTOM 获取海量测量点时，时间显著缩短。

The easy-to-use and even for beginners suitable analysis software GOM Volume Inspect allows complete CT data analysis in 3D. Geometries, shrinkage holes or internal structures and assemblies can be analysed precisely. Even the smallest defects become visible through individual sectional images and can be automatically evaluated according to various criteria. You can also load volume data of several components into a project, perform a trend analysis and compare the analysis with CAD data. In this way, the quality of your component can be exactly determined and documented - and all this in just one software.

Higher quality standards in the automotive, medical or pharmaceutical industry often make it necessary to rely on accredited CT inspection procedures. These guarantee an objective, standard-compliant measurement of parts according to VDI/VDE 2630 part 1.3. DAkkS certification is accepted worldwide, which eliminates the costs for multiple assessments. Now the DAkkS calibration is also available for the computer tomographs of the ZEISS METROTOM 800 and 1500 series! Benefit from its advantages: save costs and create more trust for your customers.

Manual filter pre-settings to scan a wide variety of parts with different materials and material compositions are no longer necessary thanks to the automatic filter changer. In this way, you can achieve reliable results even faster.

With ZEISS FixAssist CT, you can reduce machine downtimes by up to 80%. Simply position the workpiece on the pallet outside the machine before measurement, place the pre-adjusted part in the computer tomography system and start scanning immediately.

You would like to capture several parts in one scan? This is possible with the carbon fiber tower specially developed for CT applications. In this way, the measuring times per part can be drastically reduced – for increased throughput.