起订量:
免费会员
适用范围:
1.覆盖膜;导电高分子膜,高、低温电热膜;隔热、导电窗膜 导电(屏蔽)布、装饰膜、装饰纸;金属化标签、合金类箔膜;熔炼、烧结、溅射、涂覆、涂布层,电阻式、电容式触屏薄膜;电*涂料,其他半导体材料、薄膜材料方阻测试
2.硅晶块、晶片电阻率及扩散层、外延层、ITO导电箔膜、导电橡胶等材料方块电阻 半导体材料/晶圆、太阳能电池、电子元器件,导电薄膜(ITO导电膜玻璃等),金属膜,导电漆膜,蒸发铝膜,PCB铜箔膜,
3.EMI涂层等物质的薄层电阻与电阻率,导电性油漆,导电性糊状物,导电性塑料,导电性橡胶,导电性薄膜,金属薄膜,
4.抗静电材料, EMI 防护材料,导电性纤维,导电性陶瓷等,
功能描述:
1. 四探针单电测量方法
2. 液晶显示,自动测量,自动量程,自动系数补偿.
3. 集成电路系统、恒流输出.
4. 选配:PC软件进行数据管理和处理.
5. 提供中文或英文两种语言操作界面选择
参照标准:
1.硅片电阻率测量的国际标准(ASTM F84).
2.GB/T 1551-2009 《硅单晶电阻率测定方法》.
3.GB/T 1551-1995《硅、锗单晶电阻率测定直流两探针法》.
4.GB/T 1552-1995《硅、锗单晶电阻率测定直流四探针法》.
技术参数:
规格型model | HT-331 | HT-332 | HT-333 | HT-334 | HT-335 | HT-336 |
1.方块电阻范围Sheet resistance | 10-5~2×105Ω/□ | 10-4~2×105Ω/□ | 10-3~2×105Ω/□ | 10-3~2×104Ω/□ | 10-2~2×105Ω/□ | 10-2~2×104Ω/□ |
2.电阻率范围Resistivity | 10-6~2×106Ω-cm | 10-5~2×106Ω-cm | 10-4~2×106Ω-cm | 10-4~2×105Ω-cm | 10-3~2×106Ω-cm | 10-3~2×105Ω-cm |
测试电流范围 Test current | 0.1μA ,1μA,10μA,100µA,1mA,10mA,100mA | 10μA,100µA,1mA,10mA,100mA | 0.1μA ,1μA,10μA,100µA,1mA,10mA,100mA | 10μA,100µA,1mA,10mA, 100mA | 0.1μA,1μA,10μA,100µA,1mA,10mA,100mA | 1μA,10μA,100µA,1mA,10mA,100mA |
4.电流精度 Current accura | ±0.1% | ±0.2% | ±0.2% | ±0.3% | ±0.3% | ±0.3% |
5.电阻精度Resistance | ≤0.3% | ≤0.3% | ≤0.3% | ≤0.5% | ≤0.5% | ≤0.5% |
6.显示读数display | 液晶显示:电阻、电阻率、方阻、温度、单位换算、温度系数、电流、电压、探针形状、探针间距、厚度 、电导率LCD: resistance. resistivity. sheet resistance. temperature. unit conversion.temperature coefficient. current. voltage. probe shape. probe spacing. thickness. conductivity | |||||
7.测试方式test mode | 普通单电测量general single electrical measurement | |||||
8.工作电源power | 输入: AC 220V±10%.50Hz 功 耗:<30W | |||||
9.误差errors | ≤4%(标准样片结果 Standard Sample results) | |||||
10.选购功能choose to buy | 选购1.pc软件; 选购2.方形探头; 选购3.直线形探头; 选购4.测试平台;5.标准电阻 1.pc software; 2. square probe; 3. linear probe; 4. test Platform. | |||||
11.测试探头Test probe | 探针间距选购:1mm;2mm;3mm三种规格; 探针材质选购:碳化钨针;白钢针;镀金磷铜半球形针Optional probe spacing: 1mm;2mm;3mm in three sizes. Select probe material: tungsten carbide needle. white steel needle. gilded copper hemispherical needles. |